23/09/2026
What happens during LCR Dielectric Analysis?
LCR Dielectric Analysis provides much more than electrical measurements—it helps researchers understand the dielectric properties, electrical response, and frequency-dependent behaviour of materials under controlled testing conditions.
Using the ZM2376 Scanning LCR Meter by NF Corporation (Japan), researchers can evaluate key electrical parameters such as impedance, admittance, capacitance, inductance, conductance, and resistance. By analysing dielectric properties alongside phase angles, loss factors, and frequency response, the test supports detailed characterization of ceramics, polymers, dielectric materials, and semiconductor substrates.
With a broad frequency range from 1 mHz to 5 MHz and high-temperature testing capabilities up to 400°C, advanced dielectric analysis enables non-destructive material evaluation across different operating conditions. Frequency sweep measurements, multi-parameter analysis, and gold-electrode-equipped furnace testing support reliable and detailed electrical characterization.
At the Micro-Nano Research & Development Center, Parul University, advanced LCR dielectric testing supports research and material evaluation for ceramics, energy storage, electronic components, polymers, and semiconductor applications.
🔬 Explore Advanced Electrical & Dielectric Characterization at MNRDC!