Manufacturing Metrology Team

Manufacturing Metrology Team The Team carries out the fundamental research to enable the next-generation of offline and inline metrology tools for advanced manufacturing methods.

Breaking the physical barriers of optical measuring instruments using rigorous modelling and manufacturing information, we work across all Technology Readiness Levels (TRLs) to deliver bespoke solutions for manufacturing tasks. The group offers a measurement and consultancy service to industry. We ensure traceability of measurements through the use of rigorous uncertainty estimation. Our research

covers:

*exploiting the concept of “information-rich” metrology
*dimensional metrology
*internal geometry measurement and characterisation
*mathematical techniques for characterisation of advanced surfaces
*calibration and verification of instruments in industry
*precision instrument design

02/04/2019

Please note that we will be stopping using this site very soon. We would rather focus on LinkedIn and will inform you of a new site soon. For now, if you want to keep up with MMT, you can follow me on LinkedIn until the new site is up and running:

MMT student success at Advanced Manufacturing Technology Showcase Waiel Elmadih, Sofia Catalucci, and Amrozia Shaheen fr...
26/03/2019

MMT student success at Advanced Manufacturing Technology Showcase

Waiel Elmadih, Sofia Catalucci, and Amrozia Shaheen from Manufacturing Metrology Team (MMT) participated in the Advanced Manufacturing Technology Showcase at University of Nottingham The event was subdivided into three categories, specifically related to the first, second, and final year PhDs. Waiel Elmadih won the first prize in the final year category for his 3-minute thesis presentation, while Sofia Catalucci and Amrozia Shaheen won the prizes in the 2nd year category for their individual posters. The three winners now progress to the next round of the Showcase in which they will compete against winners from across the Faculty of Engineering on the 2nd May 2019.

EU PhD candidates: we have a scholarship scheme for which you can apply. Please get in touch by email if you want to app...
10/03/2019

EU PhD candidates: we have a scholarship scheme for which you can apply. Please get in touch by email if you want to apply for something in manufacturing metrology. We have projects in e.g. additive manufacturing monitoring, texture and shape measurement, artificial intelligence, X-ray computed tomography and basic physics of optical interactions. https://www.nottingham.ac.uk/studywithus/international-applicants/scholarships-fees-and-finance/scholarships/research-scholarships/research-eu.aspx

Great news: Simon Lawes from MMT has been promoted to Associate Professor. Well done Simon!
07/03/2019

Great news: Simon Lawes from MMT has been promoted to Associate Professor. Well done Simon!

Ifeanyi Echeta and Lars Körner attended iCT 2019Lars and Ifeanyi attended this year’s International Conference on Indust...
27/02/2019

Ifeanyi Echeta and Lars Körner attended iCT 2019

Lars and Ifeanyi attended this year’s International Conference on Industrial Computed Tomography (iCT). The host of the 9th iteration of this conference was the University of Padua. Over 300 attendees joined this year, adding vibrancy and diversity to the discussions during the lunch break and the poster session. With over 50 talks, several dozen poster presentations and over twenty industrial sponsors, the range of contributors this year covered a wide range of industrial perspectives in computed tomography. Even sunshine was accounted in for!

Lars gave an oral presentation on Sinogram interpolation to decrease acquisition time in X-ray computed tomography measurement of surface topography (see https://www.researchgate.net/publication/330925155_Sinogram_interpolation_to_decrease_acquisition_time_in_X-ray_computed_tomography_measurement_of_surface_topography).

ISO 213 accelerates standards development with meeting in CERN, GenevaRichard Leach attended the ISO 213 working group 1...
09/02/2019

ISO 213 accelerates standards development with meeting in CERN, Geneva

Richard Leach attended the ISO 213 working group 16 (surface texture) meeting in CERN, Geneva from 6 – 7 February 2019. The committee has a number of standards revisions and new developments underway, including: 1. Revisions of the ISO 25178 parts 2 and 3 on parameters, 2. Harmonisation of the existing profile and areal standards into the ISO 21920 series and 3. The new areal calibration standards (based on work by Richard and his team at NPL) for areal instruments (part 600 on metrological characteristics is now FDIS and part 700 on calibration is a new work item). Richard presented the work of Luke Todhunter (with Digital Surf and NPL) on mathematical software measurement standards. Many of the committee were also treated to a rare visit to the ATLAS detector whilst it is under refurbishment. Thanks to Wilfred Bauer for the photos.

New AI collaboration with MunichSamanta Piano and Danny Sims-Waterhouse visited the Faculty of Computer Science at the T...
28/01/2019

New AI collaboration with Munich

Samanta Piano and Danny Sims-Waterhouse visited the Faculty of Computer Science at the Technical University of Munich (Germany) on the 22nd and 23rd January 2019 as part of the International collaboration fund in collaboration with Dr Federico Tombari.

They had two full days visiting the computer science laboratories and having fruitful discussions with PhD students Wang Yida and Dhamo Helisa on point cloud completion, depth prediction and pose estimation and how these could be merged in a metrology scenario. The collaboration is expected to result in a number of collaborative papers.

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